view article

Figure 2
Maps for five components derived from stack-fit analysis of a C 1 s STXM image sequence recorded on a polyurethane sample which contains PIPA and SAN (copolymer pS/pAN) filler particles. The spectral models used to derive these maps are indicated. The vertical scales of the `relative paths' in the component maps are in nm, assuming unit density. Note that the negative lower limit in the polyol component map is a non-physical effect of the correlation of polyol and soft-segment matrix signals. (ALS BL 7.0 STXM instrument; Hitchcock, Koprinarov, Tyliszczak et al., 2000BB12.)

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds