Surface EXAFS study of metastable magnetic thin films

Chandesris, D.; Le Fèvre, P.; Magnan, H.; Jaffrès, H.

doi:10.1107/S0909049500016551

Figure 1
Fourier transform (between k = 2.55 and k = 12.35 Å⁻¹) of experimental EXAFS spectra recorded on a 10 ML Ni/Cu(001) film in normal incidence and in grazing incidence. Comparison with FEFF calculation using a_|| = 3.61 Å and a_⊥ = 3.42 Å.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 8| Part 2| March 2001| Pages 141-144

doi:10.1107/S0909049500016551

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