Phase determination by wavelength-modulated diffraction. I. Centrosymmetric case

Koganezawa, T.; Yoshimura, Y.; Nakamura, N.; Iwasaki, H.

doi:10.1107/S0909049501004939

Figure 1
Wavelength-modulated diffraction pattern of a single crystal of C₃₆H₃₂O₇Fe, recorded using the new diffraction apparatus, based on the modified Weissenberg camera mechanism, on a 0.575 GeV synchrotron radiation source at Ritsumeikan University. The continually varied wavelength range was 0.1722–0.1797 nm, the K-absorption edge of Fe (free atom case) being at 0.1743 nm. The sample rotation axis is parallel to the [010]* direction and is in the vertical direction, while the rotation axis of the monochromator crystal is in the horizontal plane. The layer-line screen was removed. Bragg reflections appear elongated owing to the continual change in the wavelength of radiation. The inset shows a magnified image of the 0 $[\bar2]$ 15 reflection.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 8| Part 3| May 2001| Pages 1035-1039

doi:10.1107/S0909049501004939

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