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Figure 2
Intensity profile of the 0[\bar2]15 reflection recorded in the wavelength-modulated diffraction mode using the new diffraction apparatus. The intensity is expressed in arbitrary units and the wavelength is expressed in nm. The dip in the profile indicates the position of the K-absorption edge, which is slightly different from that in the free atom case, 0.1743 nm, owing to the bonding effect (chemical shift). The intensity gradient is defined as a slope on the long-wavelength side of the absorption edge.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 8| Part 3| May 2001| Pages 1035-1039
doi:10.1107/S0909049501004939
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