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Figure 5
Time-dependent diffraction of the simulated 8 keV XFEL pulse by one (a) and two (b) Si(444) reflections.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 8| Part 5| August 2001| Pages 1131-1135
doi:10.1107/S0909049501012390
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