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Figure 6
Time-integrated diffraction intensities simulated for 400 XFEL shots after Si(111) (a) and Si(444) (b) double-crystal monochromators. Horizontal lines show the average values.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 8| Part 5| August 2001| Pages 1131-1135
doi:10.1107/S0909049501012390
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