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Figure 10
The relative lattice-spacing changes for 70 measurement points of an Si(153) wafer. The precision is within 0.2 p.p.m.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 1| December 2002| Pages 28-35
doi:10.1107/S0909049501018994
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