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Figure 3
(a) Scheme 1: SR from the bending magnet incident on the Si(111) double-crystal monochromator and, after four reflections from the MM (0.1410 nm), impinges on sample Si(444). Two diffractions are recorded at the PIN #1 and PIN #2 detectors. W1 and W2 values are recorded using a Heiden heigh encoder. (b) Pair of diffraction curves observed in scheme 1 from the Si +(444) and −(444) planes.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 1| December 2002| Pages 28-35
doi:10.1107/S0909049501018994
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