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Figure 7
Flat-field-corrected X-ray micrograph of a Ni mesh (2000mesh) recorded with an aluminium lens at 25 keV (N = 120, f = 1.05 m, L1 = 1.10 m, L2 = 23 m).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 3| April 2002| Pages 119-124
doi:10.1107/S0909049502003436
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