Figure 3
Scanning electron micrographs of various Cu/Al concentric multilayers prepared by DC sputtering deposition. (a) Full view of a multilayer with 50 layers and an outermost zone width of 0.25 µm on an Au wire substrate of diameter 50 µm. (b) A close-up view. (c) Close-up view of a multilayer with 40 layers and an outermost zone width of 0.14 µm on an Au wire substrate of diameter 50 µm. (d) Full view of a multilayer with 60 layers and an outermost zone width of 0.1 µm on an Au wire substrate of diameter 25 µm. (e) Close-up view. Black and white rings are Al and Cu layers, respectively. |