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Figure 2
(a) Experimental arrangement for section topography with the possibility of modifying the incident beam position on the sample by the displacement of the slit. Four geometries of an ingot with respect to the facet perpendicular to the c-axis (marked by the grey circle/ellipse on the top of the ingot) are presented. (b) Typical section topographs of an ingot recorded for the four different experimental geometries described in (a). The vector g is the projection of the diffraction vector onto the film.

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ISSN: 1600-5775
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