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Figure 5
Scanning microscopy image of resolution test pattern. (a) Measured image: X-ray wavelength = 1 Å, 256 × 70 pixels, 0.0625 µm pixel−1, dwell time = 0.4 s pixel−1. (b) Schematic diagram of the test pattern at the central area of the measured image.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 3| April 2002| Pages 182-186
doi:10.1107/S090904950200376X
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