Zernike-type phase-contrast hard X-ray microscope with a zone plate at the Photon Factory

Yokosuka, H.; Watanabe, N.; Ohigashi, T.; Yoshida, Y.; Maeda, S.; Aoki, S.; Suzuki, Y.; Takeuchi, A.; Takano, H.

doi:10.1107/S0909049502004211

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
Bright field X-ray image (a) and phase-contrast image (b) of a Ta test pattern at 8.97 keV. The widths of the Ta lines were in the range 0.1–3.0 µm. The images were recorded on nuclear emulsion plates. The exposure time was 30 s.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 3| April 2002| Pages 179-181

doi:10.1107/S0909049502004211

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