Elemental analysis with a full-field X-ray fluorescence microscope and a CCD photon-counting system

Ohigashi, T.; Watanabe, N.; Yokosuka, H.; Aota, T.; Takano, H.; Takeuchi, A.; Aoki, S.

doi:10.1107/S0909049502004272

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
(a) X-ray fluorescence image of metallic wires. Exposure time: 8 min. (b), (c), (d) and (e) Elemental mappings of the metallic wires calculated from 240 photon-counting X-ray fluorescence images. (b) Fe, (c) Co, (d) Ni and (e) Cu.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 3| April 2002| Pages 128-131

doi:10.1107/S0909049502004272

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