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Figure 9
Back-reflection Laue pattern of topographs of 4H-SiC wafer. The film size is 100 mm × 120 mm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 3| April 2002| Pages 174-178
doi:10.1107/S0909049502004284
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