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Figure 3
Rocking curves of the FZ-Si wafer, 220 reflection; (a) measured and (b) calculated for a ideal plane-wave with a crystal thickness of 0.360 mm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 3| April 2002| Pages 169-173
doi:10.1107/S0909049502004302
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