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Figure 4
Plane-wave topographs of the FZ-Si wafer, taken with 000 and 220 reflections at Δθ = −0.35 and −0.99 arcsec, as indicated by the arrows in Fig. 3 ![]() |
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Figure 4
Plane-wave topographs of the FZ-Si wafer, taken with 000 and 220 reflections at Δθ = −0.35 and −0.99 arcsec, as indicated by the arrows in Fig. 3 ![]() |