view article
Figure 8
Comparison of topographic images of grown-in microdefects in the slowly grown CZ-Si wafer. The topographs were taken at 6 mm, 78 mm and 215 cm from the sample using 000 and 220 reflections.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 3| April 2002| Pages 169-173
doi:10.1107/S0909049502004302
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS