Temperature- and time-resolved X-ray scattering at thin organic films

Bodenthin, Y.; Grenzer, J.; Lauter, R.; Pietsch, U.; Lehmann, P.; Kurth, D.G.; Möhwald, H.

doi:10.1107/S090904950200794X

Figure 3
Energy-dispersive reflectivity of a 15 monolayer film recorded at different incident angles displayed (a) as a function of energy and (b) after re-scaling in q_z. The curves are separated artificially by an offset of 100. The absorber thickness was 0.1 mm for α_i = 1° and 1.5°; no absorber was used for α_i = 2°.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 206-209

doi:10.1107/S090904950200794X

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