Silicon drift detectors as a tool for time-resolved fluorescence XAFS on low-concentrated samples in catalysis

Kappen, P.; Tröger, L.; Materlik, G.; Reckleben, C.; Hansen, K.; Grunwaldt, J.-D.; Clausen, B.S.

doi:10.1107/S0909049502005654

Figure 4
The energy resolution (FWHM) and the peak-to-background ratio (P/B) for the Ni K $[_\alpha]$ -fluorescence line (E = 7.47 keV) as a function of the total incoming count rate (TCR), measured for a seven-pixel SDD. A sample consisting of 1.8 wt% Ni/7.1 wt% Mo/Al₂O₃ served as a fluorescing object (irradiation with 12 keV photons).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 246-253

doi:10.1107/S0909049502005654

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