Silicon drift detectors as a tool for time-resolved fluorescence XAFS on low-concentrated samples in catalysis

Kappen, P.; Tröger, L.; Materlik, G.; Reckleben, C.; Hansen, K.; Grunwaldt, J.-D.; Clausen, B.S.

doi:10.1107/S0909049502005654

Figure 6
(a) Ex situ fluorescence XAFS at the Au L_III-edge of a catalyst consisting of 700 ppm Au and 400 ppm Pd on Al₂O₃. (b) Corresponding MCA spectrum recorded using an excitation energy of 12.7 keV. (Labels in brackets: Ar fluorescence from the ambient air and/or Pd fluorescence from the sample, Zn fluorescence from impurities.)

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 246-253

doi:10.1107/S0909049502005654

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