Silicon drift detectors as a tool for time-resolved fluorescence XAFS on low-concentrated samples in catalysis

Kappen, P.; Tröger, L.; Materlik, G.; Reckleben, C.; Hansen, K.; Grunwaldt, J.-D.; Clausen, B.S.

doi:10.1107/S0909049502005654

Figure 7
(a) Ex situ fluorescence XAFS at the Pt L_III-edge of a catalyst consisting of 157 ppm Pt and 3340 ppm Ru on Al₂O₃. (b) Corresponding MCA spectrum recorded using an excitation energy of 11.8 keV. (Labels in brackets: Ar fluorescence from the ambient air and/or Ru fluorescence from the sample, Zn and Fe fluorescence from impurities.)

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 246-253

doi:10.1107/S0909049502005654

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