Silicon drift detectors as a tool for time-resolved fluorescence XAFS on low-concentrated samples in catalysis

Kappen, P.; Tröger, L.; Materlik, G.; Reckleben, C.; Hansen, K.; Grunwaldt, J.-D.; Clausen, B.S.

doi:10.1107/S0909049502005654

Figure 8
Fourier transforms of (a) the fluorescence EXAFS spectra of the gold-containing catalysts (Au/TiO₂: full line; AuPd/Al₂O₃: dashed line), and of (b) transmission EXAFS data of a Au-foil reference (full line) and an Au₂O₃ reference (dashed line). Note that the distance scale is not corrected for the phase shift.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 246-253

doi:10.1107/S0909049502005654

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