A new bend-magnet beamline for scanning transmission X-ray microscopy at the Advanced Light Source

Warwick, T.; Ade, H.; Kilcoyne, D.; Kritscher, M.; Tylisczcak, T.; Fakra, S.; Hitchcock, A.; Hitchcock, P.; Padmore, H.

doi:10.1107/S0909049502005502

Figure 3
Measured flux transmitted into the diffraction-limited phase space through a 100 nm-thick Si₃N₄ window after the exit slit aperture. The flux is measured with entrance and exit slits changing as 1/E (60 × 20 × 20 µm at 300 eV). This keeps the spectral resolution approximately constant at about R = 2000 and keeps the exit slit aperture size matched to the diffraction limit of the fixed zone-plate lens.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 254-257

doi:10.1107/S0909049502005502

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