A new bend-magnet beamline for scanning transmission X-ray microscopy at the Advanced Light Source

Warwick, T.; Ade, H.; Kilcoyne, D.; Kritscher, M.; Tylisczcak, T.; Fakra, S.; Hitchcock, A.; Hitchcock, P.; Padmore, H.

doi:10.1107/S0909049502005502

Figure 6
X-ray image of a test pattern with 40 nm lines, spaced 40 nm apart. An average of the line profiles across the lines is shown on a normalized intensity scale. The zone plate and test pattern have been prepared by Erik Anderson, Bruce Harteneck et al. (CXRO, LBNL).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 254-257

doi:10.1107/S0909049502005502

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