Deterministic retrieval of surface waviness by means of topography with coherent X-rays

Souvorov, A.; Yabashi, M.; Tamasaku, K.; Ishikawa, T.; Mori, Y.; Yamauchi, K.; Yamamura, K.; Saito, A.

doi:10.1107/S0909049502008804

Figure 3
Example of an X-ray image taken at a distance L = 0.43 m from the substrate centre. An incident X-ray beam is reflected up in the vertical direction. Surface waviness generates one-dimensional fringes perpendicular to the incidence plane.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 223-228

doi:10.1107/S0909049502008804

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