X-ray diffraction topography using a diffractometer with a bendable mono­chromator at a synchrotron radiation source

Altin, D.; Härtwig, J.; Köhler, R.; Ludwig, W.; Ohler, M.; Klein, H.

doi:10.1107/S0909049502010294

Figure 1
Schemes of several setups and for different kinds of sources: (a) (n,−n) setup and close source (laboratory), (b) (n,−n) setup and distant source (synchrotron), (c) (n,+m) setup and close source (laboratory), and (d) (n,+m) setup and distant source (synchrotron).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 5| August 2002| Pages 282-286

doi:10.1107/S0909049502010294

Follow J. Synchrotron Rad.

Search term		doi		Advanced search
Author		volume	page