X-ray diffraction topography using a diffractometer with a bendable mono­chromator at a synchrotron radiation source

Altin, D.; Härtwig, J.; Köhler, R.; Ludwig, W.; Ohler, M.; Klein, H.

doi:10.1107/S0909049502010294

Figure 2
Plane-wave topograph of a quartz sample with induced growth striations, taken with a laboratory double-crystal (n,−n) setup using a perfect strongly asymmetric quartz monochromator [both 40 $[\bar{4}]$ 0 reflections (Bragg case, reflection geometry), Cu Kα₁ radiation, FWHM of the exit beam after the monochromator 0.16″, FWHM of the symmetrical sample reflection 0.91″, working point at 60% of the maximum intensity on the low-angle flank of the rocking curve]. The projection of the incident wavevector is indicated by k_∣∣.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 5| August 2002| Pages 282-286

doi:10.1107/S0909049502010294

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