X-ray diffraction topography using a diffractometer with a bendable mono­chromator at a synchrotron radiation source

Altin, D.; Härtwig, J.; Köhler, R.; Ludwig, W.; Ohler, M.; Klein, H.

doi:10.1107/S0909049502010294

Figure 3
Double-crystal topograph of a quartz sample with induced growth striations, taken with a synchrotron double-crystal (n,−m) setup using a bendable perfect silicon monochromator [asymmetric 448 monochromator reflection (asymmetry angle α = −17.6°) in the Bragg case, FWHM of the exit beam after the monochromator 0.31″, 80 $[\bar{8}]$ 0 sample reflection (Bragg case) with FWHM = 0.07″, but now on the high-angle flank of the rocking curve, E = 17.7 keV]. The projection of the incident wavevector is indicated by k_∣∣.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 5| August 2002| Pages 282-286

doi:10.1107/S0909049502010294

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