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![[Figure 2]](ph2011fig2mag.jpg)
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Figure 2
(a) X-ray fluorescence intensities observed after 0 to 5 xenon flashes (solid symbols) for selected excitation energies (▪ 6548.5 eV, ♦ 6551.5 eV, ▴ 6556.0 eV). The open diamonds (⋄) represent a flash pattern of fluorescence intensities obtained from ns laser-flash excitation at an X-ray energy of 6551.5 eV. The inset shows the time course of the fluorescence intensity recorded for excitation at 6551.5 eV (xenon flashes, eight transients averaged, flash-burst artefacts removed and data smoothed for clarity); the vertical bar indicates the peak-to-peak noise level of a raw single-shot trace. (b) Upper part: Mn K-edge spectra from dark-adapted PSII (solid line, S1 state), after one (dashed line) or two (dotted line) light flashes. Lower part: difference between the dark spectrum and the one-flash spectrum (small solid circles); difference between one-flash and two-flash spectra (small open circles). Large symbols represent the fluorescence changes derived from traces as shown in (a); solid circles, first flash; open circles, second flash. For clarity, the differences in the lower part of (b) have been scaled by a factor of ten. |
![[Figure 2]](ph2011fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
