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Figure 11
Evidence that beam damage continues when the sample is no longer being exposed to X-rays. Appearance of the HII phase (10) reflection in an Lα-phase background after exposing hydrated DiPOPE to (a) an accumulated dose of 46 Mrad or (b) a sub-threshold dose of 16 Mrad, before closing the shutter for 5 min then reopening to collect diffraction data. Data were collected on the ID2 beamline at the ESRF (12.5 keV, 6.3 × 1011 photons s−1, 640 krad s−1). Measurements were made with samples at 50% w/w buffer (150 mM NaCl, 20 mM TES, pH 7.4) and 305.5 K. Sample preparation is similar to the protocol described by Cherezov et al. (2000BB3).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 6| November 2002| Pages 333-341
doi:10.1107/S0909049502014528
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