Short-period multilayer X-ray mirrors

Andreev, S.S.; Bibishkin, M.S.; Chkhalo, N.I.; Kluenkov, E.B.; Prokhorov, K.A.; Salashchenko, N.N.; Zorina, M.V.; Schafers, F.; Shmaenok, L.A.

doi:10.1107/S0909049503015255

Figure 1
Short-period multilayer X-ray mirrors based on Cr/Sc. Triangles: measurements for θ = 85°. Squares: measurements for θ = 45°, where θ is the angle from the surface of the substrate and R is the reflectivity for s-polarization.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 5| August 2003| Pages 358-360

doi:10.1107/S0909049503015255

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