Short-period multilayer X-ray mirrors

Andreev, S.S.; Bibishkin, M.S.; Chkhalo, N.I.; Kluenkov, E.B.; Prokhorov, K.A.; Salashchenko, N.N.; Zorina, M.V.; Schafers, F.; Shmaenok, L.A.

doi:10.1107/S0909049503015255

Figure 4
Reflectivity of short-period multilayer mirrors with periods of 0.775–1.5 nm based on W/B₄C (X-ray tube). Triangles: measurements at Mo Kα (dotted line). Squares: measurements at Mg Kα (solid line). Circles: measurements at Cu Kα (dashed line).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 5| August 2003| Pages 358-360

doi:10.1107/S0909049503015255

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