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Figure 2
Ge K k-weighted normalized oscillating part of the X-ray absorption coefficient measured on pure Ge film (1000 Å) (bottom curve) and on Ge nanoclusters (∼15 nm × ∼1.5 nm) on Si(001) with blocking Si layer deposited at 573 K (top curve).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 10| Part 5| August 2003| Pages 380-383
doi:10.1107/S0909049503013980
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