High-resolution X-ray diffraction beamline at the LNLS for the study of charge, orbital and magnetic structures

Giles, C.; Yokaichiya, F.; Kycia, S.W.; Sampaio, L.C.; Ardiles-Saravia, D.C.; Franco, M.K.K.; Neuenschwander, R.T.

doi:10.1107/S0909049503020958

Figure 7
Orbital-ordering peak of a Pr_0.6Ca_0.4MnO₃ thin film on LaAlO₃ substrate. E = 6539 eV, T = 10 K, σ–σ graphite analyzer. The thickness of the film is about 1800 Å and this configuration introduces a compressive strain on the film. The H scan was measured at the ( $[\,\textstyle{3\over2}\,\, 2\,\,0]$ ) reciprocal point as a function of the incoming energy and its maximum coincides with the K edge of Mn.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 6| October 2003| Pages 430-434

doi:10.1107/S0909049503020958

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