Diffraction anomalous fine-structure spectroscopy at beamline BM2 at the European Synchrotron Radiation Facility

Renevier, H.; Grenier, S.; Arnaud, S.; Bérar, J.F.; Caillot, B.; Hodeau, J.L.; Letoublon, A.; Proietti, M.G.; Ravel, B.

doi:10.1107/S0909049503021332

Figure 4
(a) Raw DAFS spectrum I_d/I₀ of the (00l) superstructure reflection of a 50 nm-thick CoPt thin film, measured around the Pt L_III edge. (b) The EDAFS spectrum normalized to I_s, where I_s is the diffracted intensity without oscillations.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 6| October 2003| Pages 435-444

doi:10.1107/S0909049503021332

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