Diffraction anomalous fine-structure spectroscopy at beamline BM2 at the European Synchrotron Radiation Facility

Renevier, H.; Grenier, S.; Arnaud, S.; Bérar, J.F.; Caillot, B.; Hodeau, J.L.; Letoublon, A.; Proietti, M.G.; Ravel, B.

doi:10.1107/S0909049503021332

Figure 6
(a) q-DAFS spectrum of the (006) reflection of a GaAsP film, measured in 4 min using the feedback control described in §3.1

. (b) EDAFS of the (006) reflection of the GaAsP file, normalized to I_s. (c) q-DAFS spectrum of the (006) reflection of a GaAs substrate, with the feedback control. The FWHM of the substrate peak was 0.008°. Insets show the signal quality in terms of sampling (0.05 eV step) and signal-to-noise ratio.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 6| October 2003| Pages 435-444

doi:10.1107/S0909049503021332

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