Diffraction anomalous fine-structure spectroscopy at beamline BM2 at the European Synchrotron Radiation Facility

Renevier, H.; Grenier, S.; Arnaud, S.; Bérar, J.F.; Caillot, B.; Hodeau, J.L.; Letoublon, A.; Proietti, M.G.; Ravel, B.

doi:10.1107/S0909049503021332

Figure 9
Schematic representation of the $[\sigma]$ – $[\pi]$ and $[\sigma]$ – $[\sigma]$ scattering geometries. (O, x, y) is the plane of incidence in the schematic representation.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 6| October 2003| Pages 435-444

doi:10.1107/S0909049503021332

Follow J. Synchrotron Rad.

Search term		doi		Advanced search
Author		volume	page