High-resolution and high-intensity powder diffractometer at BL15XU in SPring-8

Ikeda, T.; Nisawa, A.; Okui, M.; Yagi, N.; Yoshikawa, H.; Fukushima, S.

doi:10.1107/S0909049503018296

Figure 4
(a) The 2θ dependence of FWHM and (b) the d-spacing dependence of Δd/d approximated by the individual profile fit. (i) Si measured at λ = 1.20001 Å using a Ge(111) analyzer, (ii) LaB₆ measured at λ = 0.63582 Å using receiving slits, (iii) LaB₆ measured at λ = 0.63582 Å using a Ge(111) analyzer, (iv) Si measured at λ = 0.63582 Å using a Ge(111) analyzer, (v) Si measured at λ = 1.54960 Å using receiving slits.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 6| October 2003| Pages 424-429

doi:10.1107/S0909049503018296

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