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Figure 3
(a) Degree of overlap of the diffraction pattern of the two pinholes at 1.4 m behind the pinhole mask for different pinhole distances D according to equation (3)[link]. (b) Minimum distance for the so-called `far-field diffraction' condition as a function of energy for different object sizes Δ. The dashed line signifies the detector distance in the present experiment.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 11| Part 2| February 2004| Pages 190-197
doi:10.1107/S0909049503029169
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