The new materials processing beamline at the SRS Daresbury, MPW6.2

Cernik, R.J.; Barnes, P.; Bushnell-Wye, G.; Dent, A.J.; Diakun, G.P.; Flaherty, J.V.; Greaves, G.N.; Heeley, E.L.; Helsby, W.; Jacques, S.D.M.; Kay, J.; Rayment, T.; Ryan, A.; Tang, C.C.; Terrill, N.J.

doi:10.1107/S0909049503027870

Figure 5
A plot of the FWHM of Si SRM 640b with angle as measured on RAPID 2, together with the corresponding increase in Lorentzian fraction as fitted with a pseudo-Voigt function. The y scale for the peak halfwidth is in degrees and is unitless for the Lorentzian fraction.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 11| Part 2| February 2004| Pages 163-170

doi:10.1107/S0909049503027870

Follow J. Synchrotron Rad.

Search term		doi		Advanced search
Author		volume	page