Development of a two-dimensional virtual-pixel X-ray imaging detector for time-resolved structure research

Orthen, A.; Wagner, H.; Martoiu, S.; Amenitsch, H.; Bernstorff, S.; Besch, H.-J.; Menk, R.-H.; Nurdan, K.; Rappolt, M.; Walenta, A.H.; Werthenbach, U.

doi:10.1107/S0909049503028863

Figure 6
Worst-case estimation of the reconstruction distortions (in percent of the cellsize), appearing at two contemporaneous events. The X marks the impact position of the first event for which the distortion is determined: (a) in the cell centre; (b) at the centre of a low-resistivity cell border; (c) at a node. The absolute value of the expected distortions on the position of the first event X are plotted as a function of the impact position of the second event. The dashed contour lines correspond to a distortion of 2.5% of the cell size, i.e. 200 µm for a cell size of g = 8 mm. The ratio between high-resistivity cell centre and low-resistivity cell border amounts to 100.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 11| Part 2| February 2004| Pages 177-186

doi:10.1107/S0909049503028863

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