Development of a two-dimensional virtual-pixel X-ray imaging detector for time-resolved structure research

Orthen, A.; Wagner, H.; Martoiu, S.; Amenitsch, H.; Bernstorff, S.; Besch, H.-J.; Menk, R.-H.; Nurdan, K.; Rappolt, M.; Walenta, A.H.; Werthenbach, U.

doi:10.1107/S0909049503028863

Figure 7
Reconstructed image of a flatfield illumination using (a) the simple four-node algorithm, (b) the four/six/three-node algorithm and (c) the four/six/three-node algorithm with subsequent non-linear correction mainly at the nodes and the cell borders. The flatfield shown has been recorded with a PCB-readout structure. Only the inner 5×5 cells corresponding to an area of 40 mm × 40 mm are depicted. A virtual pixel size of 200 µm × 200 µm has been chosen. All images contain about 4.6×10⁶ photons (mean number of photons per pixel $[N\simeq114]$ ). The standard deviation of the intensity per pixel distribution amounts to $[\sigma_N]$ = 54.9 in image (a), to $[\sigma_N]$ = 16.2 in image (b) and to $[\sigma_N]$ = 13.6 in image (c). The Poisson limit amounts to σ_N-Poisson = 114^1/2 ≃ 10.7. The black spot in the lower left-hand area (dotted circle) is caused by a defect region in one of the three GEM structures. The larger dark grey spot in the right-hand half of the image (dashed ellipse) can be attributed to an irregularity of the low-resistivity cell border.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 11| Part 2| February 2004| Pages 177-186

doi:10.1107/S0909049503028863

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