view article
Figure 2
Specular reflectivity spectrum recorded at 8325 eV on a SiO2 glass doubly implanted with 100 keV Cu+ and 100 keV Ni+ ions each at a fluence of 2 ×1016 ions cm-2. The superimposed curve is a fit to the experimental data made using the IMD program (Windt, 1998BB41). The system was modeled by a glass layer of thickness wg = 694 Å and an implanted region of thickness wi = 114 Å of composition SiO2Cu0.05Ni0.05. All these data, together with the roughness of the layers [\sigma], were refined to reproduce the reflectivity curve. The model sample obtained in this way was then used for subsequent calculations.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 11| Part 3| April 2004| Pages 272-277
doi:10.1107/S0909049504002523
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS