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![[Figure 1]](pm5003fig1mag.jpg)
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Figure 1
Schematic of the measured sample Cu (5 nm)/Ni (5 nm)/Cu (70 nm)/Co (1.8 nm)/NiO (1 nm)/GaAs(110). The thickness of the layers is given according to the characterization by Li et al. (2002  ). Polycrystalline and single-crystalline regions of the sample are indicated by PC and SC, respectively. Also shown are the experimental scattering geometries for (A) X-rays perpendicular to the wires and (B) X-rays parallel to the wires. |
![[Figure 1]](pm5003fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
