Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics

Mimura, H.; Yamauchi, K.; Yamamura, K.; Kubota, A.; Matsuyama, S.; Sano, Y.; Ueno, K.; Endo, K.; Nishino, Y.; Tamasaku, K.; Yabashi, M.; Ishikawa, T.; Mori, Y.

doi:10.1107/S090904950401283X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
Figure error profiles characterized in (a) short, (b) middle and (c) long spatial wavelength ranges to be used in the investigation of the relation between the nature of figure errors and the uniformity of diverging X-ray beams.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 11| Part 4| June 2004| Pages 343-346

doi:10.1107/S090904950401283X

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