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Figure 2
Schematic of the analyser showing the pattern of reflecting elements. Left: the dashed lines indicate the directions along which the wafer surface was scratched. Right: orientation of a single rhombus with respect to some selected crystallographic directions. The cleavage planes are the [(11\bar1)] and the [(\bar111)] planes.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 11| Part 4| June 2004| Pages 335-342
doi:10.1107/S0909049504010386
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