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Figure 5
(a) Simulated coherent X-ray diffraction pattern of a 2D object made of 2894 gold atoms in a 10 nm by 10 nm square, as shown in (b), with an oversampling ratio of 2 × 2 on a CCD detector with 255 × 255 pixels located at 10 cm from the sample. The incident coherent intensity is assumed to be a 30:1 doubly focused ERL high-coherence beam with 3 × 1014 photons s−1 µm−2. Diffracted intensities are shown on a logarithmic scale (color bar on right-hand side) and the counting time is 4 s. Statistical noise is included in the intensity signal at each pixel. (c) Examples of real-space images retrieved using the iterative phasing method, with labels showing the number of iterations in each image. (d) Azimuthally averaged coherently scattered intensity per pixel in the simulated diffraction pattern (a) as a function of Q, compared with the estimated intensity per pixel using equation (12)[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 11| Part 5| August 2004| Pages 432-438
doi:10.1107/S0909049504016772
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