Figure 3
(a) Overall stability (yB) of the exit beam of the monochromator measured with a four-quadrant beam-position monitor during a wide-band gap-scan; the intensity of the incident X-ray beam (I0) was obtained by summing up the contributions of all four quadrant diodes and is displayed for reference. Bragg glitches cancel out perfectly in the fluorescence excitation spectrum of a test sample (magnetic tape). This spectrum was not renormalized to remove the prefactor taking into account the different amplification gains of the If and I0 detectors. (b) Single-scan XANES and XMCD spectra recorded with fast electronics detecting the high-frequency time structure of the X-ray beam at 5.68 MHz in the 16-bunch filling mode. |