Advanced detection systems for X-ray fluorescence excitation spectroscopy

Goulon, J.; Rogalev, A.; Goujon, G.; Gauthier, C.; Moguiline, E.; Solé, A.; Feite, S.; Wilhelm, F.; Jaouen, N.; Goulon-Ginet, C.; Dressler, P.; Rohr, P.; Lampert, M.-O.; Henck, R.

doi:10.1107/S090904950402878X

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Figure 9
Commissioning tests of the 35-element SDD array. (a) TEM image of the Fe₇₀Pt₃₀ nanoparticles dispersed on a Si wafer. (b) XANES and XMCD spectra of the Fe₇₀Pt₃₀ nanoparticles at the Pt L_II-III edges. (c) Raw and deconvoluted emission spectra in the spectral range of the Si K $[_{\alpha\beta}]$ soft X-ray fluorescence line. (d) Raw and deconvoluted emission spectra in the energy range 6000–12000 eV.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 12| Part 1| December 2005| Pages 57-69

doi:10.1107/S090904950402878X

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